C2HRTEM

C2HRTEM simulates High Resolution Transmission Electron Microscope images and dynamical diffraction patterns from crystals, interfaces and defect structures. HRTEM represents a significant advance over previous simulation packages due to its speed and integration with structure building tools. Assists you in both the set-up and interpretation of EM experiments that investigate technologically important materials.

Brenda Pfeiffer

.Marketing Specialist
MSI
9685 Scranton Road
San Diego, CA 92121-2777
USA
619-546-5319
619-458-0136 (fax)
blp@msi.com

For applications in related solution areas, see the following indices: Analytical Chemistry, Computational Chemistry, Computational Geometry, Electron Microscopy, General Analytical Chemistry, Industrial R&D, Microscopy, Physics, Simulation, the developer index for MSI and the market segment index for Chemistry, Biochem, Biotech, Materials.